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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
1 590,00 DH
Sur commande
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.
| ISBN / EAN | 9781783265282 |
|---|---|
| Auteur | Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) |
| Editeur | Imperial College Press |