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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction
Presents an introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. This book addresses advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science.
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Presents an introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. This book addresses advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science.
| ISBN / EAN | 9781848165366 |
|---|---|
| Auteur | Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) |
| Editeur | Imperial College Press |