Radar Scattering and Imaging of Rough Surfaces

Auteur: Chen, Kun-Shan (Chinese Academy of Sciences, Beijing, China)
Editeur: Taylor & Francis Ltd
Focusing on most advanced analytical and numerical modeling, this book connects scattering process to imaging techniques by vivid examples through numerical and experimental demonstrations and provides computer codes and practical uses. This book is unique in treating radar scattering and imaging simultaneously.
Sur commande
ISBN / EAN 9781138541269
Auteur Chen, Kun-Shan (Chinese Academy of Sciences, Beijing, China)
Editeur Taylor & Francis Ltd