Characterization of Optical Materials

Auteur: Exarhos, Gregory J.
Editeur: Momentum Press
Optical materials are prized for their properties such as reflection, refraction, absorption, and diffraction of light in wavelengths ranging from 100 nm to 10 mm. This book shows readers to find the characterization of optical materials used for III-V semiconductor systems, group IV materials, and amorphous and microcrystalline semiconductors.
Sur commande
Optical materials are prized for their properties such as reflection, refraction, absorption, and diffraction of light in wavelengths ranging from 100 nm to 10 mm. This book shows readers to find the characterization of optical materials used for III-V semiconductor systems, group IV materials, and amorphous and microcrystalline semiconductors.
ISBN / EAN 9781606500507
Auteur Exarhos, Gregory J.
Editeur Momentum Press