Fundamentals of Modern VLSI Devices

Auteur: Taur, Yuan (University of California, San Diego)
Editeur: Cambridge University Press
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The internationally renowned authors highlight the interdependencies and trade-offs between practically important device parameters and discuss device scaling and scaling limits of CMOS and bipolar devices.
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ISBN / EAN 9781107635715
Auteur Taur, Yuan (University of California, San Diego)
Editeur Cambridge University Press