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Fundamentals of Modern VLSI Devices
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The internationally renowned authors highlight the interdependencies and trade-offs between practically important device parameters and discuss device scaling and scaling limits of CMOS and bipolar devices.
640,00 DH
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| ISBN / EAN | 9781107635715 |
|---|---|
| Auteur | Taur, Yuan (University of California, San Diego) |
| Editeur | Cambridge University Press |