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New Approaches to Image Processing based Failure Analysis of Nano-Scale ULSI Devices
Introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. This book presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization.
470,00 DH
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Introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. This book presents novel "smart" image processing methods, applications, and case studies concerning quality improvement of microscope images of microelectronic chips and process optimization.
| ISBN / EAN | 9780323241434 |
|---|---|
| Auteur | Zalevsky, Zeev (Faculty of Engineering and the Center for Advanced Materials and Nanotechnology, Bar-Ilan University) |
| Editeur | William Andrew Publishing |