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Next Generation HALT and HASS
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks.
1 370,00 DH
Sur commande
Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks.
| ISBN / EAN | 9781118700235 |
|---|---|
| Auteur | Gray, Kirk A. |
| Editeur | John Wiley & Sons Inc |